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Volumn 94, Issue 18, 2005, Pages

Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy

a CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIAMETER DEPENDENT; ELECTROSTATIC FORCE MICROSCOPY; NANOMETER; SINGLE-WALLED CARBON NANOTUBES;

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; NANOSTRUCTURED MATERIALS; SILICON;

CARBON NANOTUBES;

EID: 27144452028 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.94.186801 Document Type: Article

Times cited : (44)

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