Local electronic structure of single-walled carbon nanotubes from electrostatic force microscopy

Nano Letters

Volumn 5, Issue 5, 2005, Pages 853-857

  Heo, Jinseong ^a   Bockrath, Marc ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPY (EFM); QUANTUM HALL SYSTEMS; RESONANT FREQUENCY; SINGLE WALLED CARBON NANOTUBES (SWCN);

ATOMIC FORCE MICROSCOPY; BIOTECHNOLOGY; BONDING; ELECTRODES; ELECTROSTATICS; FERMI LEVEL; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS;

CARBON NANOTUBES;

CARBON NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; ELECTRICITY; ELECTROCHEMISTRY; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; MICROMANIPULATION; STIMULATION; ULTRASTRUCTURE;

ELECTROCHEMISTRY; ELECTROSTATICS; MATERIALS TESTING; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOTUBES, CARBON; PHYSICAL STIMULATION; STRESS, MECHANICAL;

EID: 19944389554     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0501765     Document Type: Article

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