Electric fields on oxidized silicon surfaces: Static polarization of PbSe nanocrystals

Journal of Physical Chemistry A

Volumn 108, Issue 39, 2004, Pages 7814-7819

  Ben Porat, Chaya H ^a   Cherniavskaya, Oksana ^a   Brus, Louis ^a   Cho, Kyung Sang ^b,c,d   Murray, Christopher B ^b  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c UNIVERSITY OF NEW ORLEANS   (United States)

^d InnovaLight Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPY (EFM); NITROGEN ATMOSPHERE; PHOTOEXCITATION; THERMAL OXIDE LAYERS;

ELECTRIC FIELDS; ELECTROSTATICS; MICROSCOPIC EXAMINATION; ORGANOMETALLICS; PERMITTIVITY; POLARIZATION; SILICON; SURFACES;

NANOSTRUCTURED MATERIALS;

EID: 6444225332     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp037418e     Document Type: Article

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