On the reliability of majority gates full adders

IEEE Transactions on Nanotechnology

Volumn 7, Issue 1, 2008, Pages 56-67

  Ibrahim, Walid ^a,b   Beiu, Valeriu ^a,b   Sulieman, Mawahib Hussein ^a,b  

^a IEEE

^b UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

Author keywords

Full adders; Majority gates; Probability of failure; Probability transfer matrix; Reliability

Indexed keywords

CHARACTERIZATION; ELECTRIC POWER UTILIZATION; PARAMETER ESTIMATION; RELIABILITY ANALYSIS;

FULL ADDER (FA); MAJORITY GATES; PROBABILITY TRANSFER MATRIX;

NANOELECTRONICS;

EID: 38149032897     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2007.915203     Document Type: Article

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