Accurate nano-circuits reliability evaluations based on combining numerical simulations with Monte Carlo

Proceedings - IDT'07 The 2nd International Design and Test Workshop

Volumn , Issue , 2007, Pages 139-144

  Ibrahim, Walid ^a,c   Beiu, Valeriu ^a,b,c   Lazarova Molnar, Sanja ^a,c  

^a UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

^b UNIVERSITY OF ULSTER   (United Kingdom)

^c Centers for Neural Inspired Nano Architectures (CNINA)

Author keywords

Bayesian networks; Monte Carlo; Nano circuits; Numerical methods; Reliability evaluation

Indexed keywords

ARCHITECTURAL DESIGN; BAYESIAN NETWORKS; COMPUTER NETWORKS; COMPUTER SIMULATION; INFERENCE ENGINES; METROPOLITAN AREA NETWORKS; MODEL STRUCTURES; MONTE CARLO METHODS; NEODYMIUM; NETWORK PROTOCOLS; NETWORKS (CIRCUITS); NUMBER THEORY; SEMICONDUCTOR COUNTERS; SYSTEMS ENGINEERING; TESTING; ULTRASONIC TRANSDUCERS;

BAYESIAN; CIRCUIT RELIABILITY; EXPECTED SIZE; EXPERIMENTAL RESULTS; INDEX TERMS; INTERNATIONAL DESIGNS; MC SIMULATIONS; MONTE CARLO (MC); MONTE CARLO SIMULATION (MCS); NEW APPROACHES; NUMERICAL SIMULATIONS; RELIABILITY EVALUATION; SIMULATION METHODS;

NUMERICAL METHODS;

EID: 44949179780     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDT.2007.4437447     Document Type: Conference Paper

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