Reliability and defect tolerance in metallic quantum-dot cellular automata

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 23, Issue 2-3, 2007, Pages 211-218

  Liu, Mo ^a   Lent, Craig S ^a  

^a University of Notre Dame   (United States)

Author keywords

Molecular electronics; Nanoelectronics; QCA; Quantum dot cellular automata; Single electronics

Indexed keywords

CELLULAR AUTOMATA; ENCODING (SYMBOLS); FAULT TOLERANCE; NANOELECTRONICS; ROBUSTNESS (CONTROL SYSTEMS); SEMICONDUCTOR QUANTUM DOTS; SHIFT REGISTERS;

BINARY INFORMATION; CLOCK PERIOD; QUANTUM-DOT CELLULAR AUTOMATA (QCA); SINGLE ELECTRONICS;

MOLECULAR ELECTRONICS;

EID: 34249915498     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-006-0627-8     Document Type: Article

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