Accurate reliability evaluation and enhancement via probabilistic transfer matrices

Proceedings -Design, Automation and Test in Europe, DATE '05

Volumn I, Issue , 2005, Pages 282-287

  Krishnaswamy, Smita ^a   Viamontes, George F ^b   Markov, Igor L ^a   Hayes, John P ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRAIC DECISION DIAGRAMS (ADD); FAULT TOLERANT DESIGN; PROBABILISTIC TRANSFER MATRICES (PTM); SOFT ERRORS;

ERROR DETECTION; FAULT TOLERANT COMPUTER SYSTEMS; GATES (TRANSISTOR); LOGIC CIRCUITS; MATRIX ALGEBRA; PROBABILISTIC LOGICS; PROBABILITY;

RELIABILITY THEORY;

EID: 33646902164     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.47     Document Type: Conference Paper

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