Reliability the fourth optimization pillar of nanoelectronics

ICSPC 2007 Proceedings - 2007 IEEE International Conference on Signal Processing and Communications

Volumn , Issue , 2007, Pages 73-76

  Lazarova Molnar, Sanja ^a   Beiu, Valeriu ^a   Ibrahim, Walid ^a  

^a UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

Author keywords

EDA; Fault models; Nanoelectronics; Reliability; Validation

Indexed keywords

DESIGN CRITERION; EDA; EDA-TOOLS; ELECTRONIC-DESIGN AUTOMATIONS; FAILURE MODELS; FAILURE RATES; FAULT MODELS; NANO-SCALE; RELIABILITY EVALUATIONS; VALIDATION;

COMPUTER AIDED DESIGN; INTEGRATED CIRCUIT LAYOUT; NANOELECTRONICS; PLANNING; SIGNAL PROCESSING; STRATEGIC PLANNING;

RELIABILITY;

EID: 60349129512     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSPC.2007.4728258     Document Type: Conference Paper

References (12)

1. D. Bhaduri. and S. Shukla, "Nanoprism: A tool for evaluating granularity vs. reliability trade-offs in nanoarchitectures," Proc. GLSVLSF04, Boston, USA, ACM, April 2004.
2. J. Srinivasan, "Lifetime reliability aware microprocessors," PhD. dissertation, Univ. of Illinois at Urbana-Champaign, May 2006. Available at: http://rsim.cs.uiuc.edu/Pubs/srinivsn-phd-thesis.pdf
3. V. Beiu, W. Ibrahim, Y. A. Alkhawwar, and M. H. Sulieman, "Gate Failures Effectively Shape Multiplexing," Proc. IEEE Intl. Symp. on Defect & Fault Tolerance in VLSI Sys. DET'06, Washington, USA, Oct. 2006, pp. 29-40.
4. M. Forshaw, R. Stadler, D. Crawley, and K. Nicolić, "A short review of nanoelectronic architectures," Nanotechnology, vol. 15, Feb. 2004, pp. S220-S223.
5. M. Hartmann, and P. C. Haddow, "Evolution of faulttolerant and noise-robust digital designs," IEE Proc. Comp. & Digital Tech., vol. 151, Jul. 2004, pp. 287-294.
6. J.A.B. Fortes, "Future challenges in VLSI system design," Proc. Intl. Symp. VLSI ISVLSI'03, Tampa, USA, Feb. 2003, pp. 5-7.
7. G. Horton, "A new paradigm for the numerical simulation of stochastic Petri nets with general firing times," Proc. European Simulation Symp. ESS'02, Dresden, Germany, Verlag, Oct. 2002. Available at http://www.scseurope.net/conf/ess2002/meth-20.pdf
8. S. Lazarova-Molnar, 'The proxel-based method: Formalisation, analysis and applications," Ph.D. dissertation, Otto-von-Guericke Univ. of Magdeburg, Germany, Nov. 2005. Available at: http://diglib.unimagdeburg.de/ Dissertationen/2005/sanlazarova.pdf
9. S. Lazarova-Molnar, and G. Horton, "A framework for performability modelling using proxels," Proc. ICMSAO'05, Sharjah, UAE, Feb. 2005,.
10. B. Haverkort, R. Marie, G. Rubino, and K. Trivedi, Performability Modelling: Techniques and Tools, John Wiley & Sons, 2001.
11. S. Lazarova-Molnar, and G. Horton, "Proxel-based simulation of a warranty model," Proc. European Sim. Multiconf. ESM'04, Magdeburg, Jun. 2004, pp. 221-224.
12. International Technology Roadmap for Semiconductors, ITRS 2005. Available at: http://public.itrs.net/