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Journal of Applied Physics

Volumn 102, Issue 7, 2007, Pages

The influence of sample conductivity on local anodic oxidation by the tip of atomic force microscope

(2) Cambel, Vladimír a Šoltýs, Ján a

a INSTITUTE OF ELECTRICAL ENGINEERING (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRIC FIELDS; SEMICONDUCTING GALLIUM ARSENIDE;

NANO-OXIDATION PROCESS; SADDLELIKE PROFILE LINES; SYSTEM TIP-SAMPLE; WATER BRIDGE;

SUPERCONDUCTIVITY;

EID: 35348893151 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2794374 Document Type: Article

Times cited : (12)

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