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Volumn 71, Issue 12, 1997, Pages 1733-1735

Fabrication of Ti/TiOx tunneling barriers by tapping mode atomic force microscopy induced local oxidation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001093456     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120019     Document Type: Article
Times cited : (81)

References (21)
  • 14
    • 85033285452 scopus 로고    scopus 로고
    • Point probes from Nanosensors GmbH, Germany
    • Point probes from Nanosensors GmbH, Germany.
  • 17
    • 85033321970 scopus 로고    scopus 로고
    • An applied external electric field of course also affects the oscillation of the cantilever. As we cannot see a significant change in the amplitude of the oscillation, but do see a mainly static deflection that causes the z piezo to withdraw the tip, the static interpretation given here seems appropriate to our experiment
    • An applied external electric field of course also affects the oscillation of the cantilever. As we cannot see a significant change in the amplitude of the oscillation, but do see a mainly static deflection that causes the z piezo to withdraw the tip, the static interpretation given here seems appropriate to our experiment.
  • 19
    • 85033295793 scopus 로고    scopus 로고
    • 2, corresponding to the transferred charge, and typical exposure times of approximately 2 pA
    • 2, corresponding to the transferred charge, and typical exposure times of approximately 2 pA.
  • 20
    • 85033301510 scopus 로고    scopus 로고
    • 2/Ti. The behaviour principle, however, is the same
    • 2/Ti. The behaviour principle, however, is the same.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.