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Volumn 117-118, Issue , 1997, Pages 652-659
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Si nanofabrication using AFM field enhanced oxidation and anisotropic wet chemical etching
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Author keywords
AFM; Anisotropic wet etching; Field enhanced oxide; Si nanofabrication; Si quantum wire; SIMOX
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ETCHING;
NANOTECHNOLOGY;
OXIDATION;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR QUANTUM WIRES;
SURFACE STRUCTURE;
THIN FILMS;
ANISOTROPIC WET ETCHING;
SEPARATION BY IMPLANTED OXYGEN (SIMOX);
SILICON WAFERS;
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EID: 0031548148
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(97)80159-6 Document Type: Article |
Times cited : (40)
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References (18)
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