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Volumn 601, Issue 13, 2007, Pages 2717-2723

AFM nanooxidation process - Technology perspective for mesoscopic structures

Author keywords

Atomic force microscope; Finite element method; GaAs AlGaAs heterostructure; Local anodic oxidation; Nanotechnology

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; ELECTRON GAS; ENERGY BARRIERS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; THERMAL EFFECTS;

EID: 34250747865     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.12.058     Document Type: Article
Times cited : (15)

References (19)
  • 19
    • 34250782972 scopus 로고    scopus 로고
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.