Field-induced formation of nanometer-sized water bridges

Physical Review Letters

Volumn 91, Issue 5, 2003, Pages 561011-561014

  Gómez Moñivas, Sacha ^a   Sáenz, Juan José ^a   Calleja, Montserrat ^b   García, Ricardo ^b  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

^b INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTROMAGNETIC WAVE POLARIZATION; INTERFACIAL ENERGY; SCANNING TUNNELING MICROSCOPY; THRESHOLD VOLTAGE;

WATER BRIDGES;

NANOSTRUCTURED MATERIALS;

EID: 0041917418     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

1. N. Agraït, A. Levy-Yeyati, and J. M. van Ruitenbeek, Phys. Rep. 377, 81 (2003); in Nanowires, edited by P. A. Serena and N. Garcia, NATO ASI, Ser. E, Vol. 340 (Kluwer Academic Publishers, Dordrecht, Boston, 1997).
2. N. Agraït, A. Levy-Yeyati, and J. M. van Ruitenbeek, Phys. Rep. 377, 81 (2003); in Nanowires, edited by P. A. Serena and N. Garcia, NATO ASI, Ser. E, Vol. 340 (Kluwer Academic Publishers, Dordrecht, Boston, 1997).
3. L. R. Fisher and J. N. Israelachvili, J. Colloid Interface Sci. 80, 528 (1981).
4. C. M. Mate, M. R. Lorenz, and V. J. Novotny, J. Chem. Phys. 90, 7550 (1989).
5. M. Schenk, M. Füting, and R. Reichelt, J. Appl. Phys. 84, 4880 (1998).
6. E. Riedo, F. Lévy, and H. Brune, Phys. Rev. Lett. 88, 185505 (2002).
7. M. Heim, R. Eschrich, A. Hillebrand, H. F. Knapp, G. Cevc, and R. Guckenberger, J. Vac. Sci. Technol. B 14, 1498 (1996); R. Guckenberger, M. Heim, G. Cevc, H. Knapp, W. Wiegräbe, and A. Hillebrand, Science 266, 1538 (1994).
8. M. Heim, R. Eschrich, A. Hillebrand, H. F. Knapp, G. Cevc, and R. Guckenberger, J. Vac. Sci. Technol. B 14, 1498 (1996); R. Guckenberger, M. Heim, G. Cevc, H. Knapp, W. Wiegräbe, and A. Hillebrand, Science 266, 1538 (1994).
9. R. García, M. Calleja, and F. Pérez-Murano, Appl. Phys. Lett. 72, 2295 (1998); R. García, M. Calleja, and H. Rohrer, J. Appl. Phys. 86, 1898 (1999).
10. R. García, M. Calleja, and F. Pérez-Murano, Appl. Phys. Lett. 72, 2295 (1998); R. García, M. Calleja, and H. Rohrer, J. Appl. Phys. 86, 1898 (1999).
11. R. D. Piner, J. Zhu, F. Xu, S. Hong, and C. A. Mirkin, Science 283, 661 (1999).
12. T. Thundat, X. Y. Zheng, G. Y. Chen, and R. J. Warmack, Surf. Sci. 294, L939 (1993); M. Luna, J. Colchero, and A. M. Baró, Appl. Phys. Lett. 72, 3461 (1998).
13. T. Thundat, X. Y. Zheng, G. Y. Chen, and R. J. Warmack, Surf. Sci. 294, L939 (1993); M. Luna, J. Colchero, and A. M. Baró, Appl. Phys. Lett. 72, 3461 (1998).
14. K. Morimoto, K. Araki, K. Yamashita, K. Morita, and M. Niwa, Appl. Surf. Sci. 117/118, 652 (1997).
15. C. Gao, Appl. Phys. Lett. 71, 1801 (1997); J.-Y. Yuan, Z. Shao, and C.Gao, Phys. Rev. Lett. 67, 863 (1991).
16. C. Gao, Appl. Phys. Lett. 71, 1801 (1997); J.-Y. Yuan, Z. Shao, and C.Gao, Phys. Rev. Lett. 67, 863 (1991).
17. A. Valencia, M. Brinkmann, and R. Lipowsky, Langmuir 17, 3390 (2001).
18. A. de Lazzer, M. Dreyer, and H. J. Rath, Langmuir 15, 4551 (1999).
19. R. G. Horn, J. Am. Ceram. Soc. 73, 1117 (1990).
20. F. Restagno, L. Bocquet, and T. Bilben, Phys. Rev. Lett. 84, 2433 (2000).
21. M. M. Kohonen, N. Maeda, and H. K. Christenson, Phys. Rev. Lett. 82, 4667 (1999).
22. Further description of the dynamic parameters needed to operate the AFM in a noncontact mode and to measure tip-sample separation can be found in R. Garcia and R. Pérez, Surf. Sci. Rep. 47, 197 (2002).
23. J. Israelachvili, Intermolecular and Surface Forces (Academic Press, London, 1992).
24. For small tip radius the short range van der Waals contribution from the tip apex is neglected in comparison with that of the flat surface. In the absence of an electrical field, this is the same approach used to analyze the stability of liquid bridges in STM [11].
25. 0 on the sample surface and it does not play a major role in determining the equilibrium shape of the neck (see also Ref. [15]).
26. S. Gómez-Moñivas, J. J. Sáenz, R. Carminati, and J. J. Greffet, Appl. Phys. Lett. 76, 2955 (2000).
27. G. Mesa, E. Dobado-Fuentes, and J. J. Sáenz, J. Appl. Phys. 79, 39 (1996).