Direct patterning of surface quantum wells with an atomic force microscope

Applied Physics Letters

Volumn 73, Issue 18, 1998, Pages 2684-2686

  Cortes Rosa, J ^a   Wendel, M ^a   Lorenz, H ^a   Kotthaus, J P ^a   Thomas, M ^b   Kroemer, H ^b  

^a UNIVERSITY OF MUNICH   (Germany)

^b University of California at Santa Barbara   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000027807     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122553     Document Type: Article

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