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Volumn 39, Issue 10, 2006, Pages

Nanolithography with coherent extreme ultraviolet light

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; LIGHT INTERFERENCE; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; PHOTOLITHOGRAPHY; ULTRAVIOLET RADIATION;

EID: 33646741447     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/10/R01     Document Type: Review
Times cited : (155)

References (55)
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    • http://public.itrs.net
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    • 26244443059 scopus 로고    scopus 로고
    • 10.1109/JPROC.2005.853538 0018-9219
    • Brueck S R J 2005 Proc. IEEE 93 1704
    • (2005) Proc. IEEE , vol.93 , Issue.10 , pp. 1704
    • Brueck, S.R.J.1
  • 16
    • 33646731733 scopus 로고    scopus 로고
    • Special cluster on extreme ultraviolet light sources for semiconductor manufacturing
    • 0022-3727 001
    • Attwood D 2004 Special cluster on extreme ultraviolet light sources for semiconductor manufacturing J. Phys. D: Appl. Phys. 37 3207-84 (ed)
    • (2004) J. Phys. D: Appl. Phys. , vol.37 , Issue.23 , pp. 3207-3284
    • Attwood, D.1
  • 28
    • 33646731302 scopus 로고    scopus 로고
    • http://www-cxro.lbl.gov/optical_constants/
  • 35


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.