Sensitivity and resolution in noncontact electrostatic force microscopy in the case of a constant potential

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 20, 2005, Pages

  Leveque G ^a   Cadet, P ^a   Arinero, R ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33344455996     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.205419     Document Type: Article

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