Electrostatic force gradient signal: Resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopy

Nanotechnology

Volumn 14, Issue 2, 2003, Pages 332-340

  Gil, A ^a,c   Colchero, J ^b,c   Gomez Herrero J ^c   Baro A M ^c  

^a CMP Cientifica   (Spain)

^b UNIVERSITY OF MURCIA   (Spain)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DNA; ELECTRIC CONDUCTIVITY; ELECTROSTATICS; MAGNETIC PROPERTIES; MATHEMATICAL MODELS; NANOTUBES;

ELECTROSTATIC FORCE GRADIENT SIGNAL; ELECTROSTATIC FORCE MICROSCOPY; ELECTROSTATIC INTERACTION; KELVIN PROBE MICROSCOPY; SCANNING FORCE MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0037293679     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/14/2/345     Document Type: Article

References (32)

1. Binnig G, Rohrer H, Gerber Ch and Weibel E 1982 Phys. Rev. Lett. 49 57-61
2. Binnig G, Quate C F and Gerber Ch 1986 Atomic force microscope Phys. Rev. Lett. 56 930-3
3. Terris B D, Stern J E, Rugar D and Mamin H J 1989 Phys. Rev. Lett. 63 2662-9
4. Schoenenberger Ch and Alvarado S F 1990 Phys. Rev. Lett. 65 3162-4
5. Abraham D W, Williams C, Slinkman J and Wichramasinghe H K 1991 J. Vac. Sci. Technol. B 9 703-6
6. Abraham D W and Wichramasinghe H K 1991 J. Vac. Sci. Technol. B 9 1559-61
7. Weaver J M R and Abraham D W 1991 J. Vac. Sci. Technol. B 9 1559-61
8. Hu J, Xiao X D, Ogletree D F and Salmeron M 1995 Science 268 267-9
9. Gil A, de Pablo P J, Colchero J, Moreno-Herrero F, Gómez Herrero J, Martínez M T and Baró A 2002 Nanotechnology 12 309-13
10. Gómez-Navarro C, Moreno-Herrero F, De Pablo P J, Colchero J, Gómez-Herrero J and Baró A M 2002 Contactless experiments on individual DNA molecules show no evidence for molecular wire behaviour Proc. Natl Acad. Sci. 99 8484-7
11. Jackson J D 1998 Classical Electrodynamics 3rd edn (New York: Wiley)
12. Kantorovich L N, Livshits A I and Stoneham A M 2000 J. Phys.: Condens. Matter 12 795-814
13. Gómez-Moñivas S, Sáenz J J, Carminatti R and Greffet J J 2000 Appl. Phys. Lett. 76 2955
14. Franz P, Agrait N and Salmeron M 1996 Langmuir 12 3289-94
15. Gao H W, Baró A M and Saenz J J 1991 J. Vac. Sci. Technol. B 9 1323-8
16. Beladi S, Girard P and Leveque G 1997 J. Appl. Phys. 81 1023-30
17. Hudlet S, Saint Jean M, Gunthmann C and Berger J 1998 Eur. Phys. J. B 2 5-10
18. Xu L and Salmeron M 2001 Nano-Surface Chemistry ed M Rosoff (New York: Marcel Dekker)
19. Jacobs H O, Leuchtmann P, Homan O J and Stemmer A 1998 J. Appl. Phys. 84 1168-73
20. Hu J, Xiao X D and Salmeron M 1995 Appl. Phys. Lett. 67 476-8
21. Colchero J, Gil A and Baró A M 2001 Phys. Rev. B 64 245403-13
22. Gómez-Moñivas S, Froufe-Pérez L S, Caamaño A J and Sáenz J J 2001 Electrostatic forces between sharp tips and metallic and dielectric samples Appl. Phys. Lett. 79 4048-50
23. Hochwitz T, Henning A K, Levey C, Daghlian C and Slinkman J 1996 J. Vac. Sci. Technol. B 14 457-62
24. Gómez-Navarro C, Gil A, Álvarez M, De Pablo P J, Moreno-Herrero F, Horcas I, Fernández R, Colchero J, Gómez-Herrero J and Baró A M 2002 Scanning force microscopy 3D-modes applied to the study of the dielectric response of adsorbed DNA molecules Nanotechnology 12 314-17
25. Nonnenmacher M, O'Boyle M P and Wichramasinghe H K 1991 Appl. Phys. Lett. 58 2921-3
26. Jacobs H O, Knapp H F, Müller S and Stemmer A 1997 Ultramicroscopy 69 39-49
27. Lü J, Delamarche E, Eng L, Bennewitz R, Meyer E and Güntherodt H-J 1999 Langmuir 15 8184-8
28. O'Boyle M P, Hwang T T and Wickramasinghe H K 1999 Appl. Phys. Lett. 74 2641
29. Gil A, Colchero J, Luna M, Gómez-Herrero J and Baró A M 2000 Adsorbtion of water on solid surfaces studied by scanning force microscopy Langmuir 16 5086-92
30. San Paulo A and García R 2002 Unifying theory of tapping-mode atomic force microscopy Phys. Rev. B 66 041406(R)
31. Hansma H G, Revenko I, Kim K and Laney D E 1996 Nucl. Acids Res. 24 713
32. Dürig U, Züger O and Stalder A 1992 Interaction force detection in scanning probe microscopy: methods and applications J. Appl. Phys. 72 1778-98