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Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1673-1679

Probe diameter and probe-specimen distance dependence in the lateral resolution of a scanning Kelvin probe

(2) McMurray, H N a Williams, G a

a SWANSEA UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EXPRESSIONS; ELECTROSTATIC CALCULATIONS; LATERAL RESOLUTION; PHYSICAL DIMENSIONS; SCANNING KELVIN PROBES; SEMI-EMPIRICAL; SURFACE POTENTIAL MEASUREMENTS;

DISSIMILAR METALS; SCANNING;

PROBES;

EID: 0036470765 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1430546 Document Type: Article

Times cited : (62)

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