Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 953-956

  Sugawara, Y ^a   Ohta, M ^a   Ueyama, H ^a   Morita, S ^a   Osaka, F ^b,e   Ohkouchi, S ^b   Suzuki, M ^c   Mishima, S ^d  

^a HIROSHIMA UNIVERSITY   (Japan)

^b Optoelectronics Technology Research Laboratory   (Japan)

^c NTT CORPORATION   (Japan)

^d OLYMPUS CORPORATION   (Japan)

^e FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001307996     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589182     Document Type: Article

References (13)

1. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. G. Binnig, Ultramicroscopy 42-44, 281 (1992).
3. F. Ohnesorge and G. Binnig, Science 260, 1451 (1993).
4. L. Howald, H. Haefke, R. Lüthi, E. Meyer, G. Gerth, H. Rudin, and H.-J. Güntherodt, Phys. Rev. B 49, 5651 (1994).
5. M. Ohta, T. Konishi, Y. Sugawara, S. Morita, M. Suzuki, and Y. Enomoto, Jpn. J. Appl. Phys. 32, 2980 (1993).
6. F. J. Giessibl, Science 267, 68 (1995).
7. S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys. 34, L145 (1995).
8. H. Ueyama, M. Ohta, Y. Sugawara, and S. Morita, Jpn. J. Appl. Phys. 34, L1086 (1995).
9. M. Ohta, Y. Sugawara, S. Morita, H. Nagaoka, S. Mishima, and T. Okada, J. Vac. Sci. Technol. B 12, 1705 (1994).
10. D. Rugar, H. J. Mamin, and P. Guethner, Appl. Phys. Lett. 55, 2588 (1989).
11. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
12. Ph. Ebert, G. Cox, U. Poppe, and K. Urban, Ultramicroscopy 42-44, 871 (1992).
13. R. J. Meyer, C. B. Duke, A. Paton, J. C. Tsang, J. L. Yen, A. Kahn, and P. Mark, Phys. Rev. B 22, 6171 (1980).