Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy

Journal of Crystal Growth

Volumn 210, Issue 1, 2000, Pages 408-415

  Morita, S ^a   Abe, M ^a   Yokoyama, K ^a   Sugawara, Y ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; ELECTROSTATICS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DOPING; SURFACE STRUCTURE;

ATOMIC CORRUGATION; ELECTRON CLOUDS;

POINT DEFECTS;

EID: 0033874492     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00720-4     Document Type: Article

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