Destructive single-event effects in semiconductor devices and ICs

IEEE Transactions on Nuclear Science

Volumn 50 III, Issue 3, 2003, Pages 603-621

  Sexton, Fred W ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC BREAKDOWN; HEAVY IONS; ION BOMBARDMENT; MOSFET DEVICES; NONVOLATILE STORAGE; SILICON ON INSULATOR TECHNOLOGY;

SINGLE-EVENT BURNOUT; SINGLE-EVENT GATE RUPTURE; SINGLE-EVENT LATCHUP; SINGLE-EVENT SNAP-BACK;

RADIATION EFFECTS;

EID: 0038382382     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.813137     Document Type: Article

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