Microbeam studies of single-event effects

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 687-695

  Sexton, F W ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; ION SOURCES; IONS; LENSES; OPTICAL COLLIMATORS; PARTICLE ACCELERATORS;

CHARGE COLLECTION MEASUREMENT; HEAVY ION MICROBEAM SYSTEM; ION BEAM INDUCED CHARGE COLLECTION; ION ENERGY; ION MASS; MAGNETICALLY FOCUSED SYSTEM; MICROBEAM LENSES; POLONIUM TIPPED WIRE; RADIOACTIVE ALPHAS SOURCES; SCANNED MICROBEAM SYSTEM;

ION BEAMS;

EID: 0030129244     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490912     Document Type: Article

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