Latchup in integrated circuits from energetic protons1

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2367-2377

  Johnston, A H ^a   Swift, G M ^a   Edmonds, L D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; INTEGRATED CIRCUIT TESTING; IONS; MICROPROCESSOR CHIPS; PROTONS; SEMICONDUCTOR DEVICE MODELS;

PROTON LATCH UP;

CMOS INTEGRATED CIRCUITS;

EID: 0031354388     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659064     Document Type: Article

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