First observations of power MOSFET burnout with high energy neutrons

IEEE Transactions on Nuclear Science

Volumn 43, Issue 6 PART 1, 1996, Pages 2913-2920

  Oberg, D L ^a   Wert, L L ^a   Normand, E ^a   Majewski, P P ^b   Wender, S A ^b  

^a BOEING COMPANY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BOMBARDMENT; NEUTRON IRRADIATION; POWER ELECTRONICS; PROTONS; RADIATION EFFECTS; SEMICONDUCTOR DEVICE TESTING; SPACECRAFT;

SINGLE EVENT BURNOUTS (SEB);

MOSFET DEVICES;

EID: 0030375854     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.556885     Document Type: Article

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