SEGR response of a radiation-hardened power MOSFET technology

IEEE Transactions on Nuclear Science

Volumn 43, Issue 6 PART 1, 1996, Pages 2944-2951

  Frank Wheatley, C ^a   Titus, Jeffrey L ^b   Burton, Donald I ^c   Carley, Donald R ^a  

^a Box 1120 ^*  (United States)

^b NAVAL SURFACE WARFARE CENTER   (United States)

^c INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; GATES (TRANSISTOR); POWER ELECTRONICS; RADIATION EFFECTS; RADIATION HARDENING; SEMICONDUCTOR DEVICE TESTING; THERMAL EFFECTS;

SINGLE EVENT GATE RUPTURE (SEGR);

MOSFET DEVICES;

EID: 0030365379     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.556890     Document Type: Article

References (6)

1. J. L. Titus and C. F. Wheatley, "Experimental Studies of Single-Event Gate Rupture and Burnout in Vertical Power MOSFETs," IEEE Trans. Nud. Sei. , Vol. 43, No. 2, pp. 533-545 (1996).
2. C. F. Wheatley, J. L. Titus, M. Allenspach, R. D. Schrimpf, D. I. Burton, J. R. Brews, K. P. Galloway, and R. L. Pease, "Influence of Ion Beam Energy on SEGR Failure Thresholds of Vertical Power MOSFETs," to be published in IEEE Trans. Nud. Sd. (Dec. 1996).
3. I. Mouret, P. Calvel, M. Allenspach, J. L. Titus, C. F. Wheatley, K. A. LaBel, M. C. Calvet, R. D. Schrimpf, and K. F. Galloway, "Measurement of a Cross-Section for Single-Event Gate Rupture in Power MOSFETs," IEEE Electron Dev. Lett. , Vol. 17, No. 4, pp. 163-165 (Apr. 1996).
4. J. H. Adams Jr. , A. J. Tylka, and B. Stiller, "LET Spectra in Low Earth Orbit," IEEE Trans, Nud. Sd. , Vol. NS-33, pp. 13861389 (1986).
5. G. H. Johnson, K. F. Galloway, R. D. Schrimpf, J. L. Titus, C. F. Wheatley, M. Allenspach, C. Dachs, "A Physical Interpretation for the Single-Event-Gate-Rupture Cross Section of N-Channel Power MOSFETs," to be published in IEEE Trans. Nud. Sd. (Dec. 1996).
6. D. R. Carley, C. F. Wheatley, J. L. Titus, and D. I. Burton, "Power MOSFETs Hardened for Single-Event Effects (SEE) in Space," RADECS 95, Third European Conf. on Radiation and Its Effects on Components and Systems, pp. 253-256, 1995.