An experimental survey of heavy ion induced dielectric rupture in Actel Field Programmable Gate Arrays (FPGAs)

IEEE Transactions on Nuclear Science

Volumn 43, Issue 3 PART 1, 1996, Pages 967-972

  Swift, Gary ^a   Katz, Richard ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; IONS; RADIATION EFFECTS; THERMAL EFFECTS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); LINEAR ENERGY TRANSFER (LET); SINGLE EVENT DIELECTRIC RUPTURE (SEDR);

LOGIC GATES;

EID: 0030169878     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.510741     Document Type: Article

References (7)

1. R. Katz, R. Barto, P. McKerracher, B. Carkliuff, and R. Koga, "SEU Hardening of Field Programmable Gate Arrays (FPGAs) for Space Applications and Device Characterization," IEEE Trans. Nucl. Sci. , Dec. 1994, p. 2179.
2. R.B. Katz and G.M. Swift, "Data on Anti-fuse/FPGA Reliability in the Heavy Ion Environment," presented at 1995 IEEE Radiation Effects Data Workshop, submitted to IEEE Trans. Nucl. Sci.
3. Haskell M. Joseph, "Radiation-Induced Effects on Special Super Large N-Channel Power MOSFETs for Space Applications," Proc. RADECS 91, Sept. 1991, p. 128.
4. D.K. Nichols, J.R. Coss, K. P. McCarty, "Single Event Gate Rupture in Commercial Power MOSFETs," Proc. RADECS 93, Sept. 1993, p. 462.
5. R.B. Katz and G.M. Swift, "An Efficient IDDQ Technique for Counting Multiple Faults," Proc. IEEE Int. Workshop on IDDQ Testing, Washington, D. C. , Oct. 1995.
6. Theodore F. Wrobel, "On Heavy Ion Induce Hard-Errors in Dielectric Structures," IEEE Trans. Nucl. Sci. , Dec. 1987, p. 1262.
7. Martin Ratliff, JPL space radiation environment specialist, personal communication.