Proton-induced dielectric breakdown of power mosfets

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2891-2897

  Titus, J L ^a   Wheatley, C F ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; FAILURE ANALYSIS; PROTON IRRADIATION; RADIATION DAMAGE; SEMICONDUCTOR DEVICE MANUFACTURE;

PROTON INDUCED DIELECTRIC BREAKDOWN;

MOSFET DEVICES;

EID: 0032307025     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736544     Document Type: Article

References (17)

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