Recent radiation damage and single event effect results for microelectronics

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1999, Pages 1-14

  O'Bryan, Martha V ^a   LaBel, Kenneth A ^a   Reed, Robert A ^a   Howard, Jim W ^a   Barth, Janet L ^a   Seidleck, Christina M ^a   Marshall, Paul W ^a   Marshall, Cheryl J ^a   Kim, Hak S ^a   Hawkins, Donald K ^a   Carts, Martin A ^a   Forslund, Kurt E ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CYCLOTRONS; ENERGY TRANSFER; HEAVY IONS; INTEGRATED CIRCUIT TESTING; ION BOMBARDMENT; MICROELECTRONICS; PROTON IRRADIATION; SIGNAL PROCESSING; SPACECRAFT;

SINGLE EVENT EFFECT; SINGLE EVENT LATCHUP; SINGLE EVENT UPSET;

RADIATION DAMAGE;

EID: 0033330816     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (17)