Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces

Applied Surface Science

Volumn 171, Issue 3-4, 2001, Pages 213-225

  Basnar, Bernhard ^a   Friedbacher, Gernot ^a   Brunner, Helmut ^a   Vallant, Thomas ^a   Mayer, Ulrich ^a   Hoffmann, Helmuth ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; MONOLAYERS; SILICON; SUBSTRATES;

SELF-ASSEMBLED MONOLAYERS (SAM); TAPPING MODE ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0035252449     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00761-3     Document Type: Article

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