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Volumn 13, Issue 14, 1997, Pages 3807-3812

Factors affecting the height and phase images in tapping mode atomic force microscopy. Study of phase-separated polymer blends of poly(ethene-co-styrene) and poly(2,6-dimethyl-1,4-phenylene oxide)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPOLYMERS; PHASE SEPARATION; POLYETHYLENES; POLYPHENYLENE OXIDES; POLYSTYRENES;

EID: 0031561078     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970091m     Document Type: Article
Times cited : (336)

References (40)
  • 2
    • 0002833736 scopus 로고
    • Bonnell, D. A., Ed.; VCH: New York, Chapter 7
    • For reviews, see: (a) Burnham, N. A.; Colton, R. J. In Scanning Tunneling Microscopy and Spectroscopy; Bonnell, D. A., Ed.; VCH: New York, 1993; Chapter 7. (b) Magonov, S. N.; Whangbo, M.-H. Surface Analysis with STM and AFM; VCH: Weinheim, 1996. (c) Sarid, D. In Scanning Force Microscopy; Lapp, M., Stark, H., Eds.; Oxford University Press: New York, 1991.
    • (1993) Scanning Tunneling Microscopy and Spectroscopy
    • Burnham, N.A.1    Colton, R.J.2
  • 3
    • 0004010634 scopus 로고    scopus 로고
    • VCH: Weinheim
    • For reviews, see: (a) Burnham, N. A.; Colton, R. J. In Scanning Tunneling Microscopy and Spectroscopy; Bonnell, D. A., Ed.; VCH: New York, 1993; Chapter 7. (b) Magonov, S. N.; Whangbo, M.-H. Surface Analysis with STM and AFM; VCH: Weinheim, 1996. (c) Sarid, D. In Scanning Force Microscopy; Lapp, M., Stark, H., Eds.; Oxford University Press: New York, 1991.
    • (1996) Surface Analysis with STM and AFM
    • Magonov, S.N.1    Whangbo, M.-H.2
  • 4
    • 0003635359 scopus 로고
    • Lapp, M., Stark, H., Eds.; Oxford University Press: New York
    • For reviews, see: (a) Burnham, N. A.; Colton, R. J. In Scanning Tunneling Microscopy and Spectroscopy; Bonnell, D. A., Ed.; VCH: New York, 1993; Chapter 7. (b) Magonov, S. N.; Whangbo, M.-H. Surface Analysis with STM and AFM; VCH: Weinheim, 1996. (c) Sarid, D. In Scanning Force Microscopy; Lapp, M., Stark, H., Eds.; Oxford University Press: New York, 1991.
    • (1991) Scanning Force Microscopy
    • Sarid, D.1
  • 14
    • 0001442772 scopus 로고
    • High Resolution Chemical Mapping Using Tapping Mode AFM with Phase Contrast
    • Chernoff, D. A. High Resolution Chemical Mapping Using Tapping Mode AFM with Phase Contrast; In Proceedings Microscopy and Microanalysis, 1995.
    • (1995) Proceedings Microscopy and Microanalysis
    • Chernoff, D.A.1
  • 28
    • 5244282306 scopus 로고
    • Paul, D. R., Newmann, S., Eds.; Academic Press: San Diego, CA
    • MacKnight, W. J.; Karasz, F. E.; Fried, J. R. In Polymer Blends; Paul, D. R., Newmann, S., Eds.; Academic Press: San Diego, CA, 1978; p 234 ff.
    • (1978) Polymer Blends
    • MacKnight, W.J.1    Karasz, F.E.2    Fried, J.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.