Investigation of the formation and structure of self-assembled alkylsiloxane monolayers on silicon using in situ attenuated total reflection infrared spectroscopy

Langmuir

Volumn 15, Issue 16, 1999, Pages 5339-5346

  Vallant, T ^a   Kattner, J ^a   Brunner, H ^a   Mayer, U ^a   Hoffmann, H ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; GROWTH (MATERIALS); INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MOLECULAR DYNAMICS; MONOLAYERS; SILICON COMPOUNDS; STRUCTURE (COMPOSITION);

IN SITU ATTENUATED TOTAL REFLECTION INFRARED SPECTROSCOPY; LANGMUIR GROWTH MODEL; SELF ASSEMBLED ALKYLSILOXANE MONOLAYERS;

LANGMUIR BLODGETT FILMS;

EID: 0032668614     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9900977     Document Type: Article

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