Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements

Surface Science

Volumn 444, Issue 1, 2000, Pages

  Bar, Georg ^a   Brandsch, Rainer ^a   Bruch, Matthias ^a   Delineau, Lydie ^a   Whangbo, M H ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (SPECIFIC GRAVITY); ENERGY DISSIPATION;

TAPPING MODE ATOMIC FORCE MICROSCOPY;

ORGANIC POLYMERS;

EID: 0033873503     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00975-9     Document Type: Article

References (19)

1. Akari S.O., van der Vegte E.W., Grim P.C.M., Belder G.F., Koutsos V., ten Brinke G., Hadziionnou G. Appl. Phys. Lett. 65:1994;1915.
2. Magonov S.N., Elings V., Whangbo M.-H. Surf. Sci. 375:1997;L385.
3. Magonov S.N., Cleveland J.P., Elings V., Denley D., Whangbo M.-H. Surf. Sci. 389:1997;201.
4. Schmitz I., Schreiner M., Friedbacher G., Grasserbauer M. Appl. Surf. Sci. 115:1997;190.
5. Spatz J.P., Sheiko S., Möller M., Winkler R.G., Reineker P., Marti O. Langmuir. 13:1997;4699.
6. Krügger D., Anczykowski B., Fuchs H. Ann. Phys. 6:1997;341.
7. Anczykowski B., Krügger D., Babcock K.L., Fuchs H. Ultramicroscopy. 66:1996;251.
8. Anczykowski B., Krügger D., Fuchs H. Phys. Rev. B. 53:1996;15485.
9. Burnham N.A., Behrend O.P., Oulevey F., Gremaud G., Gallo P.-J., Gourdon D., Dupas E., Kulik A.J., Pollock H.M., Briggs G.A.D. Nanotechnology. 8:1997;67.
10. Winkler R.G., Spatz J.P., Sheiko S., Möller M., Reineker P., Marti O. Phys. Rev. B. 54:1996;8908.
11. Tamayo J., Garcia R. Langmuir. 12:1996;4430.
12. Tamayo J., Garcia R. Appl. Phys. Lett. 71:1997;2394.
13. Chen J., Workman R.K., Sarid D., Hörper R. Nanotechnology. 5:1994;199.
14. Whangbo M.-H., Brandsch R., Bar G. Surf. Sci. 411:1998;L794.
15. Cleveland J.P., Anczykowski B., Schmid A.E., Elings V.B. Appl. Phys. Lett. 72:1998;2613.
16. Bar G., Brandsch R., Whangbo M.-H. Langmuir. 14:1998;7343.
17. Bar G., Brandsch R., Whangbo M.-H. Surf. Sci. 422:1999;L192.
18. Chen X., Davies M.C., Roberts C.J., Tendler S.J.B., Williams P.M., Davies J., Dawkes A.C., Edwards J.C. Ultramicroscopy. 75:1998;171.
19. Bar G., Delineau L., Brandsch R., Bruch M., Whangbo M.H. Appl. Phys. Lett. 1999;. in press.