On the factors affecting the contrast of height and phase images in tapping mode atomic force microscopy

Langmuir

Volumn 13, Issue 24, 1997, Pages 6349-6353

  Brandsch, R ^a   Bar, G ^a   Whangbo, M H ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD; POLYCRYSTALLINE MATERIALS; SUBSTRATES; SULFUR COMPOUNDS;

SELF ASSEMBLED MONOLAYERS (SAM);

MONOLAYERS;

EID: 0031273451     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970822i     Document Type: Article

References (39)

1. Zhong, Q.; Innis, D.; Kjoller, K.; Elings, V. B. Surf. Sci. Lett. 1993, 290, L688.
2. (a) Radmacher, M.; Tillmann, R. W.; Fritz, M.; Gaub, H. E. Science 1992, 257,1900.
3. (b) Umemura, K.; Arakawa, H.; Ikai, A. Jpn. J. Appl. Phys. 1993, 32, L1711.
4. (c) Stocker, W.; Beckmann, J.; Stadler, R.; Rabe, J. P. Macromolecules 1996, 29, 7502.
5. (d) Bustamante, C.; Keller, D. Phys. Today 1995 (Dec), 32.
6. (e) Howard, A. J.; Rye, R. R.; Houston, J. E. J. Appl. Phys. 1996, 79, 1885.
7. (f) Höper, R.; Workman, R. K.; Chen, D.; Sarid, D.; Yadav, T.; Withers, J. C.; Loutfy, R. O. Surf. Sci. 1994, 311, L731.
8. Magonov, S. N.; Elings, V.; Papkov, V. S. Polymer 1997, 38, 297.
9. (a) Magonov, S. N.; Elings, V.; Whangbo, M.-H. Surf. Sci. 1997, 375, L385.
10. (b) Whangbo, M.-H.; Magonov, S. N. ; Bengel, H. Probe Microsc. 1977, 1, 23.
11. (c) Magonov, S. N.; Cleveland, J.; Elings, V.; Denley, D.; Whangbo, M.-H. Surf. Sci., in press.
12. (d) Bar, G.; Thomann, Y.; Brandsch, R.; Cantow, H.-J.; Whangbo, M.-H. Langmuir 1997, 13, 3807.
13. (e) Whangbo, M.-H.; Bar, G.; Brandsch, R. Appl. Phys. A, in press.
14. (f) Whangbo, M.-H.; Bar, G. Surf. Sci. Lett., submitted for publication.
15. (a) Spatz, J. P.; Sheiko, S.; Möller, M.; Winkler, R. G.; Reineker, P.; Marti, O. Nanotechnology 1995, 6, 40.
16. (b) Winkler, R. G.; Spatz, J. P.; Sheiko, S.; Möller, M.; Reineker, P.; Marti, O. Phys. Rev. B 1996, 54, 8908.
17. (a) Sarid, D.; Ruskell, T. G.; Workman, R. K.; Chen, D. J. Vac. Sci. Technol., B 1996, 14, 864.
18. (b) Sarid, D.; Chen, D.; Workman, R. K. Computat. Mater. Sci. 1995, 3, 475.
19. (c) Chen, D.; Workman, R. K.; Sarid, D.; Höper, R. Nanotechnology 1994, 5, 1999.
20. Anczykowski, B.; Krüger, D.; Fuchs, H. Phys. Rev. B 1996, 53, 15485.
21. Burnham, N. A.; Behrend, O. P.; Oulevey, F.; Gremaud, G.; Gallo, P.-J.; Gourdon, D.; Dupas, E.; Kulik, A. J.; Pollock, H. M,; Briggs, G. A. D. Nanotechnology 1997, 8, 67.
22. Vinckier, A.; Dumortier, C.; Engelborghs, Y.; Hellemans, L., J. Vac. Sci. Technol., B 1996, 14, 1427.
23. Li, M.-Q.; Xu, L.; Ikai, A. J. Vac. Sci. Technol., B 1996, 14, 1410.
24. Fritz, M.; Radmacher, M.; Cleveland, J. P.; Allersma, M. W.; Steward, R. J.; Gieselmann, R.; Janmey, P.; Schmidt, C. F.; Hansma, P. K. Langmuir 1995, 11, 3531.
25. (a) Kühle, A.; Sørensen, A. H.; Bohr, J. J. Appl. Phys. 1997, 81, 6562.
26. (b) Mahoney, W.; Schaefer, D. M.; Patil, A.; Andres, R. P.; Reifenberger, R. Surf. Sci. 1994, 316, 383.
27. Van Noort, S. J.; Van der Werf, K. O.; De Grooth, B. G.; Van Hulst, N. F.; Greve, J. Ultramicroscopy, in press.
28. Ramachandran, T. R.; Kobayashi, N. P.; Heitz, R.; Chen, P.; Madhukar, A. Proceedings of the MRS Society Meeting, Boston, Fall 1996, in press.
29. (a) Kumar, A.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1994, 10, 1498.
30. (b) Bar, G.; Parikh, A. N.; Rubin, S.; Swanson, B. I.; Zawodzinski, T. A., Jr.; Whangbo, M.-H. Langmuir 1997, 13, 373.
31. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
32. 2O) < 10° for the COOH region.
33. Rao, S. S. Mechanical Vibrations, 3rd ed.; Addison-Wesley: New York, 1995.
34. (a) Martin, Y.; Williams, C. C.; Wickramasinghe, H. K. J. Appl. Phys. 1987, 61, 4723.
35. (b) Durig, U.; Züger, O.; Stalder, A. J. Appl. Phys. 1992, 72, 1778.
36. (c) Babcock, K.; Dugas, M.; Manalis, S.; Elings, V. Mater. Res. Soc. Symp. Proc. 1995, 355, 311.
37. (d) Pethica, J. B.; Oliver, W. C. Phyis. Scr., 1987, T19, 61.
38. 2: Dulcey, C. S.; George, J. H.; Chen, M.-S.; McElvany, S. W.; O'Ferrall, C. E.; Benezru, V. I.; Calvert, J. M. Langmuir 1996, 12, 1638.
39. It is of interest to consider our observation from the perspective of Sinniah et al.'s recent study. They carried out a systematic examination of the adhesive forces between tips and samples coated with alkanethiolate monolayers with different terminal groups in various solvents. In water the highest adhesion forces are found for the most Hydrophobic combination of interfaces. See: Sinniah, S. K.; Steel, A. B.; Miller, C. J.; Reutt-Robey, J. E. J. Am. Chem. Soc. 1996, 118, 8925.