Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

Ultramicroscopy

Volumn 69, Issue 2, 1997, Pages 117-127

  Van Noort, S John T ^a   Van Der Werf, Kees O ^a   De Grooth, Bart G ^a   Van Hulst, Niek F ^a   Greve, Jan ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Atomic force microscopy

Indexed keywords

ADHESION; DAMPING; OSCILLATIONS; SURFACES;

HEIGHT ANOMALIES; PHASE MISMATCH; STICKING SURFACES; TAPPING MODE;

ATOMIC FORCE MICROSCOPY;

ADHESION; ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; HEIGHT; HYDROPHOBICITY; MICROSCOPE IMAGE; OSCILLATION; PHYSICAL PHASE; SURFACE PROPERTY; WATER CONTENT;

EID: 0031238845     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00037-5     Document Type: Article

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