Pulsed force mode: a new method for the investigation of surface properties

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 336-340

  Krotil, Hans Ulrich ^a   Stifter, Thomas ^a   Waschipky, Hanka ^a   Weishaupt, Klaus ^b   Hild, Sabine ^a   Marti, Othmar ^a  

^a UNIVERSITY OF ULM   (Germany)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELASTICITY; ELECTROSTATICS; IMAGING TECHNIQUES; ORGANIC POLYMERS; SILANES;

MICROCONTACT PRINTING; PULSED FORCE MODE; SCANNING FORCE MICROSCOPY; SELF ASSEMBLY;

SURFACE PROPERTIES;

EID: 0032662378     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199905/06)27:5/6<336::aid-sia512>3.0.co;2-0     Document Type: Article

References (21)

1. A. Rosa, E. Weilandt, S. Hild and O. Marti, Meas. Sci. Technol. 8, 1 (1997).
2. T. Miyatani, M. Horii, A. Rosa, M. Fujihira and O. Marti, Appl. Phys. Lett. 71, 2632 (1997).
3. I. Luzinov, S. Minko, V. Senkovsky, A. Voronov, S. Hild, O. Marti and W. Wilke, Macromolecules 31, 3945 (1998).
4. S. Hild, A. Rosa, G. Volswinkler and O. Marti, Bull. Microsc. Soc. Can. 26, 24 (1998).
5. K. Deng, R. J. Collins, M. Mehran and C. Sukenik, J. Electrochem. Soc. 142, 127 (1995).
6. J. N. Israelachvili, Intermolecular and Surface Forces. Academic Press, London (1985).
7. G. S. Ferguson, M. K. Chaudhury, H. A. Buybuck and G. M. Whitesides, Macromolecules 26, 5870 (1993).
8. Y. Xia, M. Mrksich, E. Kim and G. M. Whitesides, J. Am. Soc. 117, 9576 (1995).
9. Y. Xia and G. M. Whitesides, Adv. Mater. 5, 471 (1995).
10. S. Hild, U. Krotil and O. Marti, in Tribology Issues and Opportunities in MEMS, edited by B. Bhushan, Kluwer, Dordrecht (1998).
11. A. Kumar and G. M. Whitesides, Appl. Phys. Lett. 14, 63 (1993).
12. E. Weilandt, B. Zink, T. Stifter and O. Marti, in Nanotribology in Electrolytic Environment in Micro/Nanotribology and its Application, NATO ASI Series, edited by B. Burnham. Kluwer Academic, Dordrecht (1996).
13. K. Kinoshita, Carbon: Electrochemical and Physicochemical Properties. Wiley, New York, (1988).
14. J. O. Besenhard and H. P. Fritz, Angew Chem. 96, 954 (1983).
15. Th. Stifter, E. Weilandt and O. Marti, Appl. Phys. A 65, 597 (1998).
16. H. A. Mizes, K.-G. Loh, R. J. Miller, S. K. Ahuja and E. F. Grabowski, Appl. Phys. Lett. 59, 2901 (1991).
17. C. E. H. Berger, K. O. van der Werf, R. P. H. Kooyman, B. G. de Grooth and J. Greve, Langmuir 11, 4188 (1995).
18. C. D. Frisbie, L. F. Rosznay, A. Noy, M. S. Wrighton and C. M. Lieber, Science 265, 2071 (1994).
19. S. Akari, D. Horn and H. Keller, Adv. Mater. 7, 594 (1995).
20. O. Marti, S. Hild, J. Staud, A. Rosa and B. Zink, in Micro/ Nanotribology and Its Application, NATO ASI Series E: Applied Sciences, edited by B. Bhushan, Vol. 330. Kluwer Academic, Dordrecht (1997).
21. S. Hild and O. Marti, Polym. Prepr. 39, 1230 (1998).