Force modulation atomic force microscopy: Background, development and application to electrodeposited cerium oxide films

Applied Surface Science

Volumn 126, Issue 1-2, 1998, Pages 21-33

  Li, Feng Bin ^a   Thompson, G E ^a   Newman, R C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Corrosion inhibition; Electrodeposited cerium oxide films; Force modulation atomic force microscopy; Gel mass intermediate in electrodeposition; Two dimensional nanoscopic mapping of mechanical properties of surfaces and films

Indexed keywords

CERIUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; ELECTRODEPOSITION; NUCLEATION; PHASE INTERFACES; PHASE SEPARATION; SURFACE STRUCTURE;

CERIUM OXIDE; FORCE MODULATION ATOMIC FORCE MICROSCOPY (FMAFM); SURFACE TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY;

EID: 0032050231     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00590-4     Document Type: Article

References (21)

1. G. Binnig, Ultramicroscopy 42-44 (1992) 7.
2. P.A. Christensen, Chem. Soc. Rev. 21 (1992) 197.
3. L.E.C. van de Leemput, H. van Kempen, Rep. Prog. Phys. 55 (1992) 1165.
4. D.A. Bonnell (Ed.), Scanning Tunneling Microscopy and Spectroscopy, Theory, Techniques and Applications, VCH Publishers, New York, 1993.
5. W.J. Lorenz, L.M. Gassa, U. Schmidt, W. Obretenov, G. Staikov, V. Bostanov, E. Budevski, Electrochim. Acta 37 (1992) 2173.
6. R.C. Bhardwaj, A.G. Martin, J.O'M. Bockris, J. Electrochem. Soc. 139 (1992) 1050.
7. J.R. LaGraff, A.A. Gewirth, J. Phys. Chem. 98 (1994) 11246.
8. A.C. Hillier, M.D. Ward, Science 263 (1994) 1261.
9. M.P. Ryan, R.C. Newman, G.E. Thompson, J. Electrochem. Soc. 141 (1994) L164.
10. Digital Instruments Application Note, Imaging Local Elasticity with Force Modulation Mode, 1993.
11. P. Marcus, J. Oudar (Eds.), Corrosion Mechanisms in Theory and Practice, Marcel Dekker, New York, 1995.
12. A.J. Aldykiewicz Jr., H.S. Isaacs, A.J. Davenport, J. Electrochem. Soc. 142 (1995) 3342.
13. A.J. Aldykiewicz Jr., A.J. Davenport, H.S. Isaacs, J. Electrochem. Soc. 143 (1996) 147.
14. A.J. Davenport, H.S. Isaacs, M.W. Kendig, Corros. Sci. 32 (1991) 653.
15. D.R. Arnoff, B.R.W. Hinton, N.E. Ryan, Corrosion 45 (1989) 12.
16. F.-B. Li, R.C. Newman, G.E. Thompson, Electrochim. Acta, in press.
17. TopoMetrix Technical Report, AFM Imaging Modes, 1993.
18. M. Fleischmann, H.R. Thirsk, in: P. Delahay (Ed.), Adv. in Electrochemistry and Electrochemical Engineering, Vol 3., Wiley-Interscience, New York, 1963, p. 123.
19. J.A. Harrison, H.R. Thirsk, in: A.J. Bard (Ed.), Electroanalytical Chemistry, Vol. 5, Marcel Dekker, New York, 1971, p. 67.
20. F.-B. Li, W.J. Albery, Electrochim. Acta 37 (1992) 393.
21. F.-B. Li, W.J. Albery, Langmuir 8 (1992) 1645.