Tip-sample force interactions and surface stiffness in scanning probe microscopy

Probe Microscopy

Volumn 1, Issue 1, 1997, Pages 23-42

  Whangbo, M H ^a   Magonov, S N ^a   Bengel, H ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; FORCE; IMAGE ANALYSIS; MICROSCOPY; OSCILLATION;

EID: 0031544450     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (37)