Effect of tip sharpness on the relative contributions of attractive and repulsive forces in the phase imaging of tapping mode atomic force microscopy

Surface Science

Volumn 422, Issue 1-3, 1999, Pages

  Bar, G ^a   Brandsch, R ^a   Whangbo, M H ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Phase imaging; Tip sharpness effect; Trapping mode atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; POLYSTYRENES; SILICON;

TAPPING MODE ATOMIC FORCE MICROSCOPY;

SURFACE CHEMISTRY;

EID: 0033076213     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00899-1     Document Type: Article

References (31)

1. Q. Zhong, D. Innis, K. Kjoller, V. Elings, Surf. Sci. 290 (1993) L688.
2. M. Radmacher, R.W. Tillmann, M. Fritz, H.E. Gaub, Science 257 (1992) 1900.
3. K. Umemura, H. Arakawa, A. Ikai, Jpn. J. Appl. Phys 32 (1993) L1711.
4. W. Stocker, J. Beckmann, R. Stadler, J.P. Rabe, Macromolecules 29 (1996) 7502.
5. C. Bustamante, D. Keller, Phys. Today December (1995) 32.
6. A.J. Howard, R.R. Rye, J.E. Houston, J. Appl. Phys. 79 (1996) 1885.
7. R. Höper, R.K. Workman, D. Chen, D. Sarid, T. Yadav, J.C. Withers, R.O. Loutfy, Surf. Sci 311 (1994) L731.
8. D.A. Chernoff, Proceedings Microscopy and Microanalysis, 1995, Jones and Begell, New York, 1995.
9. B. Anczykowski, D. Krüger, H. Fuchs, Phys. Rev. B 53 (1996) 15485.
10. B. Anczykowski, D. Krüger, K. Babcock, H. Fuchs, Ultramicroscopy 66 (1996) 251.
11. D. Sarid, T.G. Ruskell, R.K. Workman, D. Chen, J. Vac. Sci. Technol. B 14 (1996) 864.
12. D. Sarid, D. Chen, R.K. Workman, Computat. Mater. Sci. 3 (1995) 475.
13. D. Chen, R.K. Workman, D. Sarid, R. Höper, Nanotechnology 5 (1994) 1999.
14. N.A. Burnham, O.P. Behrend, F. Oulevey, G. Gremaud, P.-J. Gallo, D. Gourdon, E. Dupas, A.J. Kulik, H.M. Pollock, G.A.D. Briggs, Nanotechnology 8 (1997) 67.
15. O.P. Behrend, F. Oulevey, D. Gourdon, E. Dupas, A.J. Kulik, G. Gremaud, N.A. Burnham, Appl. Phys. A 66 (1998) S219.
16. S.N. Magonov, V. Elings, M.-H. Whangbo, Surf. Sci. 375 (1997) L385.
17. M.-H. Whangbo, S.N. Magonov, H. Bengel, Probe Microscopy 1 (1997) 23.
18. G. Bar, Y. Thomann, R. Brandsch, H.-J. Cantow, M.-H. Whangbo, Langmuir 13 (1997) 3807.
19. R. Brandsch, G. Bar, M.-H. Whangbo, Langmuir 13 (1997) 6349.
20. M.-H. Whangbo, R. Brandsch, G. Bar, Appl. Phys. A 66 (1998) S1267.
21. M.-H. Whangbo, G. Bar, R. Brandsch, Surf. Sci. 411 (1998) L794.
22. G. Bar, R. Brandsch, M.-H. Whangbo, Surf. Sci. 411 (1998) L802.
23. G. Bar, R. Brandsch, M.-H. Whangbo, Langmuir 14 (1998) 7343.
24. Y. Martin, C.C. Williams, H.K. Wickramasinghe, J. Appl. Phys. 61 (1987) 4723.
25. U. Dürig, O. Züger, A. Stalder, J. Appl. Phys. 72 (1992) 1778.
26. K. Babcock, M. Dugas, S. Manalis, V.B. Elings, Mater. Res. Soc. Symp. Proc. 355 (1995) 311.
27. J.B. Pethica, W.C. Oliver, Physica Scripta T19 (1987) 61.
28. J.P. Cleveland, B. Anczykowski, A.E. Schmid, V.B. Elings, Appl. Phys. Lett. 72 (1998) 2613.
29. J. Tamayo, R. Garcia, Langmuir 12 (1996) 4430.
30. J. Israelachvili, Intermolecular and Surface Forces, 2nd Ed., Academic Press, New York, 1991., Section 15.5.
31. J. Israelachvili, Intermolecular and Surface Forces, 2nd Ed., Academic Press, New York, 1991., Section 14.5.