Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces

Applied Surface Science

Volumn 115, Issue 2, 1997, Pages 190-198

  Schmitz, I ^a,b   Schreiner, M ^a,b   Friedbacher, G ^a   Grasserbauer, M ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b Akademie der Bildenden Kunste Wien   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC AEROSOLS; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; SURFACE PROPERTIES;

TAPPING MODE ATOMIC FORCE MICROSCOPY (TMAFM);

IMAGING TECHNIQUES;

EID: 0031168804     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)80204-8     Document Type: Article

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