Single-event effects in SOI technologies and devices

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 603-613

  Musseau, O ^a  

^a CEA DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; MOSFET DEVICES; RANDOM ACCESS STORAGE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES; THIN FILMS;

MICROELECTRONIC DEVICES; PARASITIC THYRISTOR STRUCTURE; PARTIAL DEPLETION; SILICON FILMS; SINGLE EVENT EFFECTS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0030129873     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490904     Document Type: Article

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