Implications Of Angle Of Incidence In Seu Testing Of Modern Circuits

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2049-2054

  Reed, R A ^a   McNulty, P J ^a   Abdel Kader, W G ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTRIC SPACE CHARGE; PROTONS; RADIATION EFFECTS; RADIOACTIVITY MEASUREMENT; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS;

ANGLE OF INCIDENCE; SINGLE EVENT UPSET;

INTEGRATED CIRCUITS;

EID: 0028699689     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340541     Document Type: Article

References (10)

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3. R.A. Reed, P.J. McNulty, W.J. Beauvais, W.G. Abdel Kader, J.L. Barth, and E.G. Stassinopoulos, IEEE Trans. Nucl. Sci., (1994), a paper in this issue.
4. Jim Pickel, private communication.
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10. J. Dreute, H. Rocher, W. Heinrich, R. Harboe Sorensen, L. Adams, and D. Schardt, Proc. of 2nd European Conf. and Its Effects on Components and Systems, J.L. Leray and 0. Musseau Eds. (Saint-Malo, France, Sept. 13–16, ‘1993) pp. 479-484.