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Volumn 40, Issue 6, 1993, Pages 1812-1819

The shape of heavy ion upset cross section curves

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC CHARGE; ION BEAMS; IONS; NUMERICAL METHODS; PARTICLE ACCELERATORS; SPACE APPLICATIONS; STATISTICAL METHODS;

EID: 0027853304     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273475     Document Type: Article
Times cited : (23)

References (12)
  • 1
    • 0001671884 scopus 로고
    • Rate Prediction for Single Event Effects - A Critique
    • December
    • E.L. Petersen, J.C. Pickel, J.H. Adams, Jr. and E.C. Smith, “Rate Prediction for Single Event Effects - A Critique,” IEEE Trans. Nucl. Sci. 39, pp. 1577–1599, December 1992.
    • (1992) IEEE Trans. Nucl. Sci , vol.39 , pp. 1577-1599
    • Petersen, E.L.1    Pickel, J.C.2    Adams, J.H.3    Smith, E.C.4
  • 3
    • 84939361680 scopus 로고    scopus 로고
    • Analytical Correlation Between Observed Non-Ideal SEU Cross Section Data and Process Parameter Distributions
    • this issue
    • L.W. Massengill, M.L. Alles, S.E. Kerns and K. Jones, “Analytical Correlation Between Observed Non-Ideal SEU Cross Section Data and Process Parameter Distributions,” IEEE Trans. Nucl. Sci., this issue.
    • IEEE Trans. Nucl. Sci
    • Massengill, L.W.1    Alles, M.L.2    Kerns, S.E.3    Jones, K.4
  • 4
    • 0024942859 scopus 로고
    • Depletion Region Geometry Analysis Applied to Single Event Sensitivity
    • December
    • J.B. Langworthy, “Depletion Region Geometry Analysis Applied to Single Event Sensitivity,” IEEE Trans. Nucl. Sci. 36, pp. 2427–2434, December 1989.
    • (1989) IEEE Trans. Nucl. Sci , vol.36 , pp. 2427-2434
    • Langworthy, J.B.1
  • 5
    • 0024902710 scopus 로고
    • SEU Characterization of a Hardened CMOS 64K and 256K SRAM
    • December
    • F.W. Sexton, J.S. Fu, R.A. Kohler and R. Koga, “SEU Characterization of a Hardened CMOS 64K and 256K SRAM,” IEEE Trans. Nucl. Sci. 36, pp. 2311–2317, December 1989.
    • (1989) IEEE Trans. Nucl. Sci , vol.36 , pp. 2311-2317
    • Sexton, F.W.1    Fu, J.S.2    Kohler, R.A.3    Koga, R.4
  • 8
    • 0000883655 scopus 로고
    • Applicability of LET to Single Events in Microelectronic Structures
    • December
    • M.A. Xapsos, “Applicability of LET to Single Events in Microelectronic Structures,” IEEE Trans. Nucl. Sci. 39, pp. 1613–1621, December 1992.
    • (1992) IEEE Trans. Nucl. Sci , vol.39 , pp. 1613-1621
    • Xapsos, M.A.1
  • 11
    • 0019243357 scopus 로고
    • Simulation of Cosmic Ray-Induced Soft Errors in CMOS/SOS Memories
    • December
    • G.J. Brucker, W. Chater and W.A. Kolasinski, “Simulation of Cosmic Ray-Induced Soft Errors in CMOS/SOS Memories,” IEEE Trans. Nucl. Sci. 27, pp. 1490–1493, December 1980.
    • (1980) IEEE Trans. Nucl. Sci , vol.27 , pp. 1490-1493
    • Brucker, G.J.1    Chater, W.2    Kolasinski, W.A.3
  • 12


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.