Temporal analysis of SEU in SOI/GAA SRAMs

IEEE Transactions on Nuclear Science

Volumn 42, Issue 6, 1995, Pages 2127-2137

  Francis, P ^a   Colinge, J P ^b   Berger, G ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b Cyclotron Research Centre ^*

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; RANDOM ACCESS STORAGE; SILICON ON INSULATOR TECHNOLOGY; XENON;

GATE ALL AROUND (GAA) DEVICE; SINGLE EVENT UPSETS (SEU);

RADIATION HARDENING;

EID: 0029490980     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.489263     Document Type: Article

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