Single event upset in sos integrated circuits

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1713-1717

  Rollins, J G ^a,b   Choma, J ^a,b   Kolasinski, W A ^a  

^a AEROSPACE CORPORATION   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84886549239     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337542     Document Type: Article

References (8)

1. M. R. Pinto, C. S. Rafferty, H. R. Yeager, R. W. Dutton, PISCES-IIb Users Guide and Supplementary Report, Stanford Electronics Laboratories, Stanford University, (1985)
2. L. W. Nagel, SPICE2 Users Guide, Electronics Research Laboratory, University of California Berkeley, (1975)
3. J. S. Fu, H. T. Weaver, R. Koga, W. A. Kolasinski, “Comparison of 2D Memory SEU Transport Simulation with Experiments,” IEEE Trans. Nuc. Sci. NS-32, No. 6, pp 4145–4150 (1985)
4. J. G. Rollins, J. Choma, Jr. “Mixed-Mode PISCES-SPICE Coupled Circuit and Device Solver,” submitted, IEEE Trans. Computer Aided Design
5. G. E. Davis, L. R. Hite, T. G. Blake, C.-E. Chen, H. W. Lam, R. DeMoyer, Jr., “Transient Radiation Effects in SOI Memories,” IEEE Trans Nuc. Sci. NS-32, No. 6, pp 4432–4438, (1985)
6. C. Hu, “Alpha-Particle-Induced Field Enhanced Collection of Carriers,” IEEE Elect. Dev. Let. EDL-3 31, (1982)
7. A. B. Campbell, A. R. Knudson, W. J. Stapor, P. Shapiro, S. E. Diehl-Nagel, J. Hauser, “Charge Collection in CMOS-SOS Structures,” IEEE Trans. Nuc. Sci. NS-32, No. 6, pp 4128–4133, (1985)
8. R. Koga, W. A. Kolasinski, “Heavy-Ion Induced Single Event Upsets of Modern Microcircuits,” IEEE Trans. Nuc. Sci. NS-31, No. 6, pp 1190–1196, (1984)