“Body tie placement in CMOS/SOI digital circuits for transient radiation environments”

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1259-1264

  Clark, J E ^b   Jones, K L ^b   Lowther, R E ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; ELECTRONIC CIRCUITS, DIGITAL;

TRANSIENT RADIATION ENVIRONMENTS;

INTEGRATED CIRCUITS, CMOS;

EID: 0026385069     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124102     Document Type: Article

References (9)

1. S.E. Kerns, L.W. Massengill, D.V. Kerns, Jr., M.L. Alles, T.W. Houston, H. Lu, and L.R. Hite, “Model for CMOS/SOI Single-Event Vulnerability”, IEEE Transactions on Nuclear Science, pp. 2305–2310, Dec 1989.
2. M.L. Alles, “A Lumped Parameter Model for Simulation of Single-Event Event Radiation Effects on Small Geometry Silicon-on-Insulator Transistors”, Masters Thesis, Vanderbilt University, 1990.
3. L.W. Massengill, D.V. Kerns, Jr., S.E. Kerns, and M.L. Alles, “Single-Event Event Charge Enhancement in SOI Devices”, IEEE Electron Device Letters, pp. 98–99, Feb 1990.
4. M. Alles, KL. Jones, J.E. Clark, J.C. Lee W.F Kraus, S.E. Kerns, and L.W. Massengill, “Rad-Hard SOI/SRAM Design Using a Predictive SEU Device Model”, Government Microcircuit Applications Conference Digest of Papers, pp. 443–445, 1990.
5. J.H. Hohl and G.H Johnson, “Features of the Triggering Mechanism for Single-Event Burnout of Power MOSFET's”, IEEE Transactions on Nuclear Science, pp. 2260–2266, Dec 1989.
6. G.E. Davis, L.R. Hite, T.G. Blake, C.E. Chen, H.W. Lam and R. DeMoyer, Jr., “Transient Radiation Effects in SOI Memories”, IEEE Transactions on Nuclear Science, pp. 4432–4437, Dec 1985.
7. L.W. Massengill, “The Simulation of Pulsed-Ionizing-Radiation-Induced Errors in CMOS Memory Circuits”, Dissertation, North Carolina State University, 1987.
8. L.W Massengill, “TRIGSPICE; Transient Radiation Inclusive and GaAs SPICE”, Technical Memo, North Carolina State University, 1985.
9. W. M. Webster “On the Variation of Junction-Transistor Current Amplification Factor with Emitter Current”, Proceedings IRE, vol. 42, pp. 914, 1954.