Transient radiation effects in SOI memories

IEEE Transactions on Nuclear Science

Volumn 32, Issue 6, 1985, Pages 4431-4437

  DeMoyer, R ^d   Blake, T G W ^c   Chen, C E ^c   Lam, H W ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

^c TEXAS INSTRUMENTS   (United States)

^d UNITED STATES NAVAL ACADEMY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939039762     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4334137     Document Type: Article

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