Applicability of let to single events in microelectronic structures

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1613-1621

  Xapsos, Michael A ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000883655     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211343     Document Type: Article

References (18)

1. J.F. DiCello, M. Wasiolek and M. Zaider, “Measured Microdosimetric Spectra of Energetic Ion Beams of Fe, Ar, Ne and C: Limitations of LET Distributions and Quality Factors in Space Research and Radiation Effects,” IEEE Trans. Nucl. Sci. 38, and references therein, pp. 1203–1209, December 1991.
2. A.M. Kellerer, “Fundamentals of Microdosimetry” in The Dosimetry of Ionizing Radiation, K.R. Kase, et al., Eds., New York: Academic Press, 1985, pp. 77–162.
3. A.M. Kellerer and D. Chmelevsky, “Criteria for the Applicability of LET,” Radiat. Research 63, pp. 226–234, 1975.
4. J.H. Adams, Jr., R. Silberberg and G.D. Badhwar, “Calculation of the Vavilov Distribution,” Nucl. Inst. Meth. 124, pp. 551–556, 1975.
5. P. Olko and J. Booz, “Energy Deposition by Protons and Alpha Particles in Spherical Sites of Nanometer to Micrometer Diameter,” Radiat. Environ. Biophys. 28, pp. 1–17, 1990.
6. A.M. Kellerer, “An Assessment of Wall Effects in Microdosimetric Measurements,” Radiat. Research 47, pp. 377–386, 1971.
7. M.A. Xapsos, “A Spatially-Restricted Linear Energy Transfer Equation,” to be published in Radiat. Research, December 1992.
8. ICRU Report 16, “Linear Energy Transfer,” International Commission on Radiation Units and Measurements, Bethesda, MD, 1970.
9. M.J. Berger and S.M. Seltzer, “Stopping Powers and Ranges of Electrons and Positrons,” NBSIR 82–2550, 2550, pp. 46–48, August 1982.
10. P.J. Vail and E.A. Burke, “Fundamental Limits Imposed by Gamma Dose Fluctuations in Scaled MOS Gate Insulators,” IEEE Trans. Nucl. Sci. 31, pp. 1411–1416, December 1984.
11. C.J. Tung, J.C. Ashley, V.E. Anderson and R.H. Ritchie, “Inverse Mean Free Path, Stopping Power, CSDA Range and Straggling in Silicon and Silicon Dioxide for Electrons of Energy < 10 keV,” RADC-TR-76-125, RADC Technical Report, April 1976.
12. J.F. Ziegler, Stopping Cross Sections for Energetic Ions in All Elements, Volume 5, New York: Pergamon Press, 1980, pp. 1.
13. E.L. Petersen, J.C. Pickel, J.H. Adams and E.C. Smith, “Rate Prediction for Single Event Effects,” to be published in IEEE Trans. Nucl. Sci., December 1992.
14. P.J. McNulty, W.G. Abdel-Kader and J.E. Lynch, “Modeling Charge Collection and Single Event Upsets in Microelectronics,” Nucl. Inst. Meth. B61, pp. 52–60, 1991.
15. E.A. Burke, J.J. Boyle and H.J. Huemmler, “Gamma-Induced Noise in CCDs,” IEEE Trans. Nucl. Sci. 28, pp. 4068–4073, December 1981.
16. L.V. Spencer and F.H. Attix, “A Theory of Cavity Ionization,” Radiat. Research 3, pp. 239–254, 1955.
17. E.A. Burke, “Soft X-ray Induced Electron Emission,” IEEE Trans. Nucl. Sci. 24, pp. 2505–2511, 2511, December 1977.
18. P.J. Vail, E.A. Burke and J.P. Raymond, “Scaling of Gamma Dose Rate Upset Threshold in High Density Memories,” IEEE Trans. Nucl. Sci. 30, pp. 4240–4245, December 1983.