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Volumn 40, Issue 6, 1993, Pages 1555-1560

Study of a CMOS-JFET-bipolar radiation hard analog-digital technology suitable for h1gh energy physics electronics

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; CONSTRAINT THEORY; ELECTRONIC EQUIPMENT; MICROELECTRONICS; MONOLITHIC INTEGRATED CIRCUITS; PARTICLE ACCELERATORS; RADIATION; VLSI CIRCUITS;

EID: 0027875515     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273505     Document Type: Article
Times cited : (32)

References (9)
  • 1
    • 84939318737 scopus 로고
    • Letter of intent for a General Purpose Experiment at the Large Hadron Collider at CERN
    • 1 October
    • ATLAS, Letter of intent for a General Purpose Experiment at the Large Hadron Collider at CERN; CERN/LHCC/92-4/I2; 1 October 1992.
    • (1992) CERN/LHCC/92-4/I2
  • 2
    • 84939366038 scopus 로고    scopus 로고
    • CERN-TIS/RP/92-07 CF
    • G.Stevenson et al, CERN-TIS/RP/92-07 CF.
    • Stevenson, G.1
  • 3
    • 84939380832 scopus 로고
    • Radiation dose expected in LHC inner detectors
    • 22 july
    • Th.Mouthuy, Radiation dose expected in LHC inner detectors, ATLAS internal note, INDET.NO.12, 22 july 1992.
    • (1992) ATLAS internal note, INDET.NO.12
    • Mouthuy, T.1
  • 5
    • 0026976469 scopus 로고
    • A Hardened Technology on SOI for Analog devices
    • IEEE proceedings, 91TH0400-2
    • E.Dupont-Nivet et all., “A Hardened Technology on SOI for Analog devices”, RADECS conference 1991, IEEE proceedings, 91TH0400-2, 15, p211.
    • (1991) RADECS conference , vol.15 , pp. 211
    • Dupont-Nivet, E.1
  • 6
    • 0003495751 scopus 로고
    • Ionizing Radiation Effects in MOS Devices and Circuits
    • J.Wiley & Sons, New York
    • T.P.Ma and P.V.Dressendorfer, “Ionizing Radiation Effects in MOS Devices and Circuits”, J.Wiley & Sons, New York (1989).
    • (1989)
    • Ma, T.P.1    Dressendorfer, P.V.2
  • 7
    • 0004005306 scopus 로고
    • Physics of Semiconductor Devices
    • J.Wiley & Sons, New York
    • S.M.Sze, “Physics of Semiconductor Devices”, J.Wiley & Sons, New York (1981).
    • (1981)
    • Sze, S.M.1
  • 8
    • 0022600166 scopus 로고
    • Simple technique for separating the effects of interface traps and trapped-oxide charge in metal-oxide-semiconductors transistors
    • 13 january
    • P.J. McWhorter and P.S. Winokur, “Simple technique for separating the effects of interface traps and trapped-oxide charge in metal-oxide-semiconductors transistors”, Appl.Phys.Lett. 48 (2), 13 january 1986.
    • (1986) Appl.Phys.Lett , vol.48 , Issue.2
    • McWhorter, P.J.1    Winokur, P.S.2
  • 9
    • 0003705471 scopus 로고
    • The Effects of Radiation on Electronic Systems
    • Van Nostrand Reinhold Co., New York
    • C.G.Messenger and S.M.Ash, “The Effects of Radiation on Electronic Systems”, Van Nostrand Reinhold Co., New York (1986).
    • (1986)
    • Messenger, C.G.1    Ash, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.