Reconstructing atom probe data: A review

Ultramicroscopy

Volumn 132, Issue , 2013, Pages 19-30

  Vurpillot, Francois ^a   Gault, Baptiste ^b   Geiser, Brian P ^c   Larson, D J ^c  

^a UNIVERSITÉ DE ROUEN   (France)

^b MCMASTER UNIVERSITY   (Canada)

^c CAMECA   (United States)

Author keywords

Atom probe tomography; Image projection; Reconstruction; Simulations

Indexed keywords

ATOM PROBE; ATOM PROBE TOMOGRAPHY; HIGH SPATIAL RESOLUTION; IMAGE PROJECTION; MATERIALS CHARACTERISATION; SIMULATIONS; THREE-DIMENSIONAL RECONSTRUCTION; TOMOGRAPHIC RECONSTRUCTION;

ATOMS; IMAGE RECONSTRUCTION; OPTICAL PROJECTORS;

PROBES;

ACCURACY; ARTICLE; ATOM PROBE TOMOGRAPHY; COMPUTER SIMULATION; CRYSTALLOGRAPHY; DATA PROCESSING; DYNAMICS; IMAGE ANALYSIS; IMAGE PROCESSING; MATHEMATICAL MODEL; PHYSICAL PARAMETERS; PROCESS OPTIMIZATION; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

EID: 84884168742     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.03.010     Document Type: Article

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