Electrostatic analysis of local-electrode atom probes

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 464-471

  Bajikar, Sateesh S ^a   Kelly, Thomas F ^a   Camus, Patrick P ^a  

^a University of Wisconsin Madison ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CALCULATIONS; ELECTRIC FIELDS; ELECTRODES; ELECTROSTATICS; FINITE ELEMENT METHOD; GEOMETRY; PERFORMANCE; PROBES;

ATOM PROBES; LOCAL EXTRACTION ELECTRODES; SPECIMEN TIP;

OPTICAL INSTRUMENTS;

EID: 0030562662     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00411-4     Document Type: Article

References (8)

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3. D.J. Larson, C.-M. Teng, P.P. Camus and T.F. Kelly, Appl. Surf. Sci. 87/88 (1995) 446.
4. J.A. Liddle, A. Norman, A. Cerezo and C.R.M. Grosvener, J. Phys. (Paris) Colloq. C 6, 49 (1988) C6-509.
5. S.S. Bajikar, T.F. Kelly, C.-M. Teng and P.P. Camus, Appl. Surf. Sci. 87/88 (1995) 438.
6. O. Nishikawa, M. Kimoto and Y. Ishikawa, J. Vac. Sci. Technol. B 13 (1995) 599.
7. ANSYS, Swanson Analysis Systems, Inc., Houston, PA 15342-0065, USA.
8. D.J. Larson, P.P. Camus and T.F. Kelly, Appl. Surf. Sci. 94/95 (1996) 434.